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High-speed film thickness measurement and mapping tool.
Capable of 4" to 8" Wafers High-speed film thickness measurement and mapping tool designed specifically for leading edge characterization of advanced Vibration Immune "ertial Isolation"
Interferometer Model based FT-IR Analysis Self-compensating
Auto Align Optics Pre-aligner for Automated Wafer Positioning
Pre-aligner for Automated Wafer Positioning
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408-654-9500
