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Category   >> Ellipsometers/Film Thickness Measurement   >> Rudolph Auto EL III Ellipsometer (Maximum wafer size 150mm)

Rudolph Auto EL III Ellipsometer (Maximum wafer size 150mm)

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Ellipsometer. Internal data reduction software for single and double layer transparent films. 633 nm wavelength. 6 in. dia. quickload stage. Built in printer. Measuring time 17 to 50 secs Rudolph Auto EL III Ellipsometer Ellipsometer. Internal data reduction software for single and double layer transparent films. 633 nm wavelength. 6 in. dia. quickload stage. Built in printer. Measuring time 17 to 50 secs Sample stage: movement X/YSECS II InterfaceInternal data reduction software Built in Printer

ASSET#4412