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Category   >> Ellipsometers/Film Thickness Measurement   >> KLA-Tencor Surfscan 4500 Particle Inspection Analyzer
Category   >> Inspection Systems   >> KLA-Tencor Surfscan 4500 Particle Inspection Analyzer
Category   >> Metrology - Test & Inspection System   >> KLA-Tencor Surfscan 4500 Particle Inspection Analyzer
Category   >> New Arrivals   >> KLA-Tencor Surfscan 4500 Particle Inspection Analyzer

KLA-Tencor Surfscan 4500 Particle Inspection Analyzer

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408-654-9500
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A laser-based system that scans the entire substrate surface, producing color-coded graphic displays and hardcopy printouts of particles locations.

 

KLA-Tencor Surfscan 4500 Features/Specifications:

  • Sub micron particles, down to 0.2µm are readily detected.
  • Measurement time : 30 sec on 6" wafers
  • Particles Sensitivity : 0.2µm diameter latex spheres.
  • Haze Sensitivity : 0.4ppm
  • Spatial Resolution : 50µm spacing minimum Spatial R
  • Measurement Range : 0.004µm and 102µm in twelve ranges and 256 gradations

For more information on the Surfscan series, click here.