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Category   >> Inspection Systems   >> Dektak 3030 Surface Profiler
Category   >> Metrology - Test & Inspection System   >> Dektak 3030 Surface Profiler
Category   >> New Arrivals   >> Dektak 3030 Surface Profiler

Dektak 3030 Surface Profiler

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Dektak 3030 Surface Profiler

Dektak 3030 Surface Profiler Specifications:

  • Stylus: 12.5 um radius (Diamond)
  • Scan Range: x: 50 um − 50 mm; z: 100 A − 131 um
  • z Resolution: 1 A/65  KA; 10 A/655 KA; 20 A/1310 KA
  • Force: 1 - 40mg
  • Zoom: 35x - 200x
  • Scan Speed Rangers: Low, Med, High
  • Leveling: Manual, Two point programmable or curso leveling
  • Stylus Tracking Force: Programmable, 1-40mg (0.01-0.4 milli Newtons)
  • Max. Sample Thickness: 45mm
  • Max. Sample Weight: 0.5Kg (1lb)
  • Sample Stage Diamete: 165mm
  • Sample Stage Translation: X Axis, + 76mm (from center); Y Axis, 76mm
  • Sample Stage Rotation: Theta, 360°
  • Power Requirements: 100/115/220Vac + 10%, 50-60Hz, 200VA
  • Warm-up Time: 15 mins recommended
  • Operating Temperature: 21°C + 3°C (70°F + 5°F)